INTERNAL VISUAL EXAMINATION:

 Condition 'B'

HIGH TEMP STORAGE:

 24H @ +150 C

TEMP. CYLCE:

 -65 to +150 C, 10 cycles

CONSTANT ACCELERATION:

 49,000 m/s squared (5000g), Y1 axis, 1 minute

FINE LEAK:

 Tracer Gas (helium) - test Qk

GROSS LEAK:

 Fluorocarbon bubble method- test Qc

BURN IN:

 160H(minimum) @+125 C

POST BURN-IN ELECTRICAL:

 As detailed in spec.

PDA CALCULATION:

 %Defects allowed -as specified (typically 5% or 10%)

FINAL ELECTRICAL TESTS:

 Static Charachteristics @ -55, +25 and +125 C

DYNAMIC CHARACTERISTICS @ +25 C

 

EXTERNAL VISUAL INSPECTION

 

Optolinks screeing processes are long and intensive to ensure maximum lifespan from our components. Many customers like to know about how the devices they are purchasing have been screened and this section is here to show you:

QUALITY SYSTEM:

Our approved quality system: structured responses to customer requirements, disciplined development programmes.,BS9000 incorporating ISO9002 approved manufacturing site and CECC20000 - the european system standard for the quality assurance of electronic components.

If you have any further questions regarding the information on this page please contact us.

SCREENING:

TESTED CRITERIA: